Browsing Makale Koleksiyonu by Subject "scanning electron microscopy"
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Wet-chemical etching of GaAs(211)B wafers for controlling the surface properties
(Inderscience Enterprises Ltd, 2019)Substrate surface plays an important role to achieve high performance infrared devices and high-quality film layers. GaAs (211)B wafers were intensively used in infrared detector applications. Despite 'epiready' wafers can ...